Puncture Resistance

Instron® test for puncture resistance

Slow Puncture (Instron® testing system)

Puncture Resistance of substrates can be measured using an Instron®testing instrument fitted with a special clamping fixture to hold the sample. The probe is attached to the load cell and is forced at a slow speed into the sample until failure. The load cell measures the force required to puncture the substrate sample. Substrates with high puncture resistance are preferable for medical devices, especially those which are heavy or have sharp edges.

Spencer Impact Method

Puncture Resistance may also be measured by the Spencer Impact method, which uses an Elmendorf tear tester modified for the purpose.

Elmendorf digital

Dart Drop

The Dart Drop Test is a useful method used to compare impact resistance of packaging materials. This includes films, foils, laminations, papers, non-wovens and rigid sheet. The method involves dropping a weighted dart with a specific profile onto a clamped sample and observing whether the sample is punctured. Drop heights, weights and profiles can be adjusted to show differences between candidate substrates.